Electron Microscopy
Transmission electron Microscope
Transmission electron microscopy (TEM) is a powerful imaging technique that uses a beam of electrons to pass through ultra-thin samples, creating highly detailed images of their internal structure. It provides high-resolution visualization of materials down to the atomic level, making it ideal for studying the fine structure of cells, viruses, and nanomaterials. CryoTEM is available.
FEI Tecnai G2 20 TWIN (200KV), LaB6, Gatan Oneview CMOS 4kx4k
FEI Tecnai G2 20 TWIN (200KV), LaB6, FEI Eagle 4k & Olympus Veleta
Scanning electron Microscope
Scanning electron microscopy (SEM) uses an electron beam that scans across a sample’s surface, producing high-resolution, three-dimensional images of its surface topography and composition. This technique is especially useful for visualizing the detailed texture, morphology, and surface features of materials. SEM is widely used in fields like materials science, biology, and geology to analyze microstructures and surface characteristics.
One of our SEM is equipped with a Serial Blockface module to enable automated sectioning and 3D imaging of resin-embedded samples.
FEI Teneo VS, Serial BlockFace-SEM,
Low Vacuum
Tescan VEGA3 SBU,
Low-Vacuum
